Below are the references for journal articles and conference papers authored by Professor John Rodenburg.

  • For free access to the abstract/article click on the 'View this article in WRRO' hyperlink, where available. This will redirect you to the White Rose Research Online (WRRO) website.
  • Alternatively, click on the hyperlinked title to read the abstract/article. Please note that access to these may require a paid subscription.

Journal articles

Chapters

Conference proceedings papers

  • Rodenburg JM, Cao S & Maiden AM (2016) OPTICAL ARRANGEMENTS FOR PHASE-SENSITIVE IMAGING USING ELECTRON PTYCHOGRAPHY. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 60-61) RIS download Bibtex download
  • Rodenburg JM (2014) Ptychography: lensless high-resolution phase-sensitive imaging (pp cm3d.2) RIS download Bibtex download
  • Claus D, Iliescu D, Watson J & Rodenburg J (2012) Comparison of different digital holographic setup configurations. Digital Holography and Three-Dimensional Imaging, DH 2012 RIS download Bibtex download
  • Rodenburg JM (2012) Ptychography - early history and 3D scattering effects. SHORT-WAVELENGTH IMAGING AND SPECTROSCOPY SOURCES, Vol. 8678 RIS download Bibtex download
  • Claus D, Robinson DJ, Chetwynd DG, Shuo Y, Pike WT & Rodenburg JM (2012) Ptychography applied to optical metrology. SPECKLE 2012: V INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, Vol. 8413 RIS download Bibtex download
  • Rodenburg JM, Maiden AM & Humphry MJ (2010) TRANSMISSION AND REFLECTION MICROSCOPY WITHOUT LENSES. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 61-62) RIS download Bibtex download
  • Liu C, Walther T & Rodenburg JM (2008) Investigating the influence of dynamic scattering on ptychographical iterative techniques. EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 723-724). Berlin, 1 September 2008 - 5 September 2008. RIS download Bibtex download
  • Walther T, Atkinson K, Sweeney F & Rodenburg JM (2008) Measuring coherence in an electron beam for imaging. EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 165-166). Berlin, 1 September 2008 - 5 September 2008. RIS download Bibtex download
  • Atkinson KM, Sweeney F & Rodenburg JM (2008) STEM probe characteristics at large defoci for use in ptychographical imaging. - art. no. 012092. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12092-12092) RIS download Bibtex download
  • Fielden IM & Rodenburg JM (2004) A technique for real-time, in situ SEM observation of grain growth at elevated temperatures. RECRYSTALLIZATION AND GRAIN GROWTH, PTS 1 AND 2, Vol. 467-470 (pp 1385-1388) RIS download Bibtex download
  • Xu H, Akid R, Brumpton G, Wang H & Rodenburg JM (2004) Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 417-420) RIS download Bibtex download
  • Rodenburg JM (2004) Can Ronchigrams provide a route to sub-angstrom tomographic reconstruction?. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 185-190) RIS download Bibtex download
  • Fielden IM, Cawley J & Rodenburg JM (2004) Backscattered SEM imaging of high-temperature samples for grain growth studies in metals. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 181-184) RIS download Bibtex download
  • Macak EB, Munz WD & Rodenburg JM (2002) Electron microscopy studies of hard coatings deposited on sharp edges by combined cathodic arc/unbalanced magnetron PVD. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 349-354) RIS download Bibtex download
  • Meidia H, Cullis AG, Schonjahn C, Munz WD & Rodenburg JM (2002) Investigation of intermixing in TiAlN/VN nanoscale multilayer coatings by energy-filtered TEM. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 209-213) RIS download Bibtex download
  • Macak EB, Munz WD & Rodenburg JM (2001) Quantitative EDX-analysis of PVD hard coatings deposited on sharp edges. ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 345-348) RIS download Bibtex download
  • Rodenburg JM (2001) Time- and space-dependent image contrast mechanisms in environmental scanning electron microscopy (ESEM). ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 73-76) RIS download Bibtex download
  • Rodenburg JM & Lupini AR (1999) Measuring lens parameters from coherent Ronchigrams in STEM. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 339-342) RIS download Bibtex download
  • Rodenburg JM (1999) Measurement of higher-order correlation functions in amorphous materials via coherent microdiffraction. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 145-148) RIS download Bibtex download
  • James EM & Rodenburg JM (1997) A method for measuring the effective source coherence in a field emission transmission electron microscope. APPLIED SURFACE SCIENCE, Vol. 111 (pp 174-179) RIS download Bibtex download
  • Colman CP & Rodenburg JM (1997) Super-resolution STEM imaging of crystals with large unit cells. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 117-120) RIS download Bibtex download
  • James EM, Bleloch AL & Rodenburg JM (1997) A novel ultra-sharp field emission electron source demonstrated in a STEM. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 65-68) RIS download Bibtex download
  • Landauer MN & Rodenburg JM (1995) Experimental tests of double-resolution imaging with quadrant detectors in the STEM. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 281-284) RIS download Bibtex download
  • James EM, McCallum BC & Rodenburg JM (1995) Measurement and improvement of the effective source coherence in STEM. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 277-280) RIS download Bibtex download
  • Plamann T & Rodenburg JM (1995) Ptychographical imaging of sphalerite structures. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 117-120) RIS download Bibtex download
  • Colman CP & Rodenburg JM (1995) Super-resolution STEM imaging in the presence of specimen drift. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 107-110) RIS download Bibtex download
  • PLAMANN T & RODENBURG JM (1994) Simulations on super-resolution imaging of perfect crystals. ELECTRON MICROSCOPY 1994, VOL 1 (pp 939-940) RIS download Bibtex download
  • NELLIST PD, MCCALLUM BC & RODENBURG JM (1994) STEM imaging of <110> tetrahedral semiconductors. ELECTRON MICROSCOPY 1994, VOL 1 (pp 489-490) RIS download Bibtex download
  • MCCALLUM BC, RODENBURG JM & NELLIST PD (1994) Direct measurement of the effective source coherence in STEM. ELECTRON MICROSCOPY 1994, VOL 1 (pp 209-210) RIS download Bibtex download
  • LANDAUER MN & RODENBURG JM (1994) Double-resolution imaging with quadrant detectors in STEM. ELECTRON MICROSCOPY 1994, VOL 1 (pp 155-156) RIS download Bibtex download
  • KAWASAKI T & RODENBURG JM (1993) DECONVOLVING LENS TRANSFER-FUNCTIONS IN ELECTRON HOLOGRAMS. ULTRAMICROSCOPY, Vol. 52(3-4) (pp 248-252) RIS download Bibtex download
  • LANDAUER MN & RODENBURG JM (1993) DIRECT COMPLEX TRANSFER-FUNCTION RECONSTRUCTION BY PROCESSING OF NEAR-FOCUS SHADOW IMAGES IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 251-254) RIS download Bibtex download
  • PLAMANN T & RODENBURG JM (1993) THICKNESS LIMITATIONS OF ABERRATION-FREE PROJECTION IMAGING. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 243-246) RIS download Bibtex download
  • NELLIST PD & RODENBURG JM (1993) IMAGE-RESOLUTION IMPROVEMENT USING COHERENT MICRODIFFRACTION IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 239-242) RIS download Bibtex download
  • AITCHISON PR, RODENBURG JM & BROWN LM (1993) INFORMATION IN RONCHIGRAMS OF A SUPERLATTICE FROM DEFOCUSED MICRODIFFRACTION IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 167-170) RIS download Bibtex download
  • FRIEDMAN SL, RODENBURG JM & MCCALLUM BC (1991) PHASE RECONSTRUCTION IMAGING IN SCANNING-TRANSMISSION MICROSCOPY VIA THE MICRODIFFRACTION PLANE. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 491-494) RIS download Bibtex download
  • AITCHISON PR & RODENBURG JM (1991) MICRODIFFRACTION MEASUREMENTS OF STRAIN IN A STEM. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 409-412) RIS download Bibtex download
  • AKROBOTU KH & RODENBURG JM (1991) APERTURE FRINGE EFFECTS IN COHERENT CBED PATTERNS. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 395-396) RIS download Bibtex download
  • RODENBURG JM & RAUF IA (1990) A CROSS-CORRELATION MEASURE OF ORDER IN AMORPHOUS INDIUM OXIDE. EMAG-MICRO 89, VOLS 1 AND 2, Vol. 98 (pp 119-122) RIS download Bibtex download
  • RODENBURG JM (1990) HIGHER SPATIAL-RESOLUTION VIA SIGNAL-PROCESSING OF THE MICRODIFFRACTION PLANE. EMAG-MICRO 89, VOLS 1 AND 2, Vol. 98 (pp 103-106) RIS download Bibtex download
  • MUROOKA Y, RODENBURG JM & WALLS MG (1990) HIGH-RESOLUTION TIME RESOLVED EELS AND CACO3. TRANSACTIONS OF THE ROYAL MICROSCOPICAL SOCIETY : NEW SERIES, VOL 1, Vol. 1 (pp 185-188) RIS download Bibtex download
  • BROWN LM, RODENBURG JM & PIKE WT (1988) MICRODIFFRACTION. EUREM 88, VOLS 1-3, Vol. 93 (pp 3-8) RIS download Bibtex download