Dr Thomas WaltherDr Thomas Walther


email : t.walther@sheffield.ac.uk

tel: +44 (0) 114 222 5891

Current Position

Qualifications and Previous Positions

  • Dipl.-Phys. (MSc equiv.), RWTH Aachen, Germany (1993): physics
  • PhD, University of Cambridge, UK (1996 / 97): materials science
  • Postdoc at CEA Grenoble and Université d’Aix-Marseille III, France (1997): metallurgy
  • Scientist (1998-2003) and from 2000 also Hochschulassistent (lecturer / assistant prof. equiv.) at Universität Bonn, Germany: inorganic chemistry
  • Project leader (2003-6) at Center of Advanced European Studies and Research, Bonn, Germany: nano-technology
  • Postgraduate tutor of Department of EEE (2008-11)

Professional Society Memberships

  • Fellow of the Institute of Physics (IoP), London
  • Fellow of the Royal Microscopical Society, Oxford
  • Member of the European MicroBeam Analysis Society (EMAS), Karlsruhe
  • Member of the German Physics Society (Deutsche Physikalische Gesellschaft, DPG)
  • Member of the German Society for Electron Microscopy (DGE)

Research Interests

Trying to understand how materials grow by investigating their microstructure, their crystallography and chemistry; measurement of diffusion and segregation in solids by:

  • Transmission Electron Microscopy (TEM)
  • High-Resolution Electron Microscopy (HREM)
  • Annular Dark-Field imaging (ADF) and Z-contrast in Scanning TEM (STEM)
  • Electron Energy-Loss Spectroscopy (EELS), including Energy-Loss Near-Edge Structure (ELNES)
  • Energy-Dispersive X-ray Spectroscopy (EDXS)

Research Projects

  • Quantitative chemical mapping of embedded semiconductor nano-structures (islands, quantum dots), using advanced analytical TEM methods
  • Development of new methods for quantitative TEM investigations
  • Modelling of X-ray emission in thin films and fluorescence by stray X-rays in electron microscopy, using Monte Carlo simulations (MSc projects available)
  • cathodoluminescence
  • aberration correction in (S)TEM