Dr Conny RodenburgDr C. Rodenburg (nee Schönjahn)

Senior Lecturer Materials Science and Engineering
EPSRC Early Career Fellow
Dipl. Ing (FH), PhD

Telephone: +44 (0) 114 222 5921
Fax: +44 (0) 114 222 5943
Email: c.rodenburg@shef.ac.uk

Address: Department of Materials Science and Engineering, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD

Dr Rodenburg was awarded a Royal Society Dorothy Hodgkin Fellowship entitled "Applications of MEMS electrostatic manipulation in SEM and materials science" which she took up in 2006, and after a brief spell as University teacher, now holds an EPSRC Early Career Fellowship and is a Senior Lecturer in Materials Science & Engineering.


Current research interests:

My research is centered on the use of electrons and ions for the characterisation and modification of micro-and nanostructured materials. This includes the development and application of novel characterisation techniques, alongside the study of damage and charging phenomena for targeted materials properties modification and transport. Recent key projects include:

  • Nano-morphology of polymer blends for organic photovoltaics (collaboration with Trinity College Dublin and UoS Department of Physics)
  • Novel Polymer composites for Additive manufacturing (collaboration with UoS Mechanical Engineering (Advanced Additive Manufacturing Group))
  • Secondary electron spectroscopy in the scanning electron microscope (collaboration with FEI company) and EPSRC funded project. Read more
  • Characterisation of Natural materials

Previous research interests:

  • The role of the substrate/coating interface of ceramic hard coatings for dry high speed cutting applications
  • Influence of carbide distributions on properties and wear of high speed steels

Research centres

Research group

Research associates:

  • Dr Vikas Kumar: Novel Electron microscopy methods for complex organic-inorganic hybrid systems
  • Dr Kerry Abrams: Novel Electron microscopy methods for complex polymers

PhD students:

  • Alaa Almansoori: Novel polymer composites
  • Sameer Hamad: Enhancing mechanical properties of nano-structured materials through the use of low energy electron and/or ion beams
  • Nicola Stehling: Electron microscopy natural materials
Professional activities and recognition
  • 12 invited presentations since 2009, including Microscopy and Microanalysis Meeting 2010 (Portland, USA) and 2011(Nashville, USA), Recent trends in Charged Particle Optics and Surface Physics Instrumentation 2010 and 2016, Slavski Davur, Czech Republic
  • Member of IOP and VDI
Selected Publications
  • Q. Wan, K. J. Abrams, R. C. Masters, A. C. S. Talari, I. U. Rehman, F. Claeyssens, C. Holland, C. Rodenburg, Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging, Adv. Mater. 2017, 1703510. https://doi.org/10.1002/adma.201703510
  • Almansoori, A., C. Majewski, and C. Rodenburg. "Nanoclay/Polymer Composite Powders for use in Laser Sintering Applications-Effects of Nanoclay Plasma Treatment." JOM: Journal of the Minerals, Metals and Materials Society (2017). https://link.springer.com/article/10.1007/s11837-017-2408-5
  • Kumar, V., Schmidt, W.L., Schileo, G., Masters, R.C., Wong-Stringer, M., Sinclair, D.C., Reaney, I.M., Lidzey, D. and Rodenburg, C., 2017. Nanoscale Mapping of Bromide Segregation on the Cross Sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in a Scanning Electron Microscope. ACS Omega, 2(5), pp.2126-2133. http://pubs.acs.org/doi/abs/10.1021/acsomega.7b00265
  • Masters, R.C., Wan, Q., Zhang, Y., Dapor, M., Sandu, A.M., Jiao, C., Zhou, Y., Zhang, H., Lidzey, D.G. and Rodenburg, C., 2017. Novel organic photovoltaic polymer blends: A rapid, 3-dimensional morphology analysis using backscattered electron imaging in the scanning electron microscope. Solar Energy Materials and Solar Cells, 160, pp.182-192.
  • Masters, R. C., Pearson, A. J., Glen, T. S., Sasam, F. -C., Li, L., Dapor, M., . . . Rodenburg, C. (2015). Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy. Nature Communications, 6, 6928. doi:10.1038/ncomms7928
  • Zhou, Y., Fox, D. S., Maguire, P., O’Connell, R., Masters, R., Rodenburg, C., . . . Zhang, H. (2016). Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. Scientific Reports, 6, 21045. doi:10.1038/srep21045
  • Wan, Q., Masters, R. C., Lidzey, D., Abrams, K. J., Dapor, M., Plenderleith, R. A., . . . Rodenburg, C. (2016). Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: simulation & experiment for polymers. Ultramicroscopy, 171, 126-138. doi:10.1016/j.ultramic.2016.09.006
  • Masters, R. C., Wan, Q., Zhang, Y., Dapor, M., Sandu, A. M., Jiao, C., . . . Rodenburg, C. (2017). Novel organic photovoltaic polymer blends: A rapid, 3-dimensional morphology analysis using backscattered electron imaging in the scanning electron microscope. Solar Energy Materials and Solar Cells, 160, 182-192. doi:10.1016/j.solmat.2016.10.029
  • Pearson A.J., Boden S.A., Bagnall, D.M., Lidzey D.G., C. Rodenburg, Imaging the Bulk Nanoscale Morphology of Organic Solar Cell Blends Using Helium Ion Microscopy, NANO LETTERS 11 (10) (2011) 4275-4281
  • Rodenburg C., Liu X., Jepson M.A.E., Boden S.A., Brambilla G., Surface morphology of silica nanowires at the nanometer scale, Journal of Non-Crystalline Solids 357 (15)(2011) 3042-3045.
  • Rodenburg C., Jepson M.A.E., Bosch.E., Dapor.M. (2010) ‘Energy selective scanning electron microscopy to reduce the effect of contamination layers on Scanning Electron Microscope Dopant Mapping’, Ultramicroscopy 110 1185-1191.
  • Rodenburg C., Liu X., Jepson M.A.E., Zhou Z., Rainforth W.M., Rodenburg W.J. (2010) ‘The role of helium ion microscopy in the characterisation of complex three-dimensional nanostructures’, Ultramicroscopy 110  1178-1184.
  • Schönjahn C., Broom R.F., Humphreys C.J, Howie A., Mentink S.A.M. (2003) 'Optimizing and quantifying dopant mapping using a scanning electron microscope with a through-the-lens detector'. Applied Physics Letters. 83(2) 293-295.
  • Schönjahn C., Humphreys C.J., Glick M. 'Energy-filtered imaging in a field-emission scanning electron microscope for dopant mapping in semiconductors'. Journal of Applied Physics. 92 (2002) 7667-71.