@inproceedings{inproceedings, title  = {{Package-related degradation condition monitoring of SiC power MOSFETs using current distribution anomaly detection}},

 publisher = {{Institution of Engineering and Technology (IET)}},

 url = {{https://doi.org/10.1049/icp.2022.1145 }},

 year = {{2022}},

 month = {{7}},

 author = {{Naghibi J and Mohsenzade S and Mehran K and Foster MP}},

 doi = {{10.1049/icp.2022.1145}},

 volume = {{2022}},

 journal = {{IET Conference Proceedings}},

 issue = {{4}},

 pages = {{728-732}},

 note = {{Accessed on 2025/11/23}}}