TY  - JOUR

T1  - Competing reversal mechanisms and edge roughness in thin micron-scale ferromagnetic ring elements

JO  - Intermag 2006 IEEE International Magnetics Conference

PY  - 2006/12/01

AU  - Hayward TJ

AU  - Van Belle F

AU  - Bland J

ED  - 

DO  - DOI: 10.1109/INTMAG.2006.374971

SP  - 940

Y2  - 2025/11/21

ER  -