TY  - CONF

T1  - The effect of white etching layer patches on a larger rail defect

JO  - MATEC Web of Conferences

UR  - https://eprints.whiterose.ac.uk/id/eprint/130468

UR  - https://doi.org/10.1051/matecconf/201713500077

PY  - 2017/11/20

AU  - Sanusi SH

AU  - Fletcher D

ED  - 

DO  - DOI: 10.1051/matecconf/201713500077

VL  - 135

Y2  - 2025/11/06

ER  -