TY  - JOUR

T1  - X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

JO  - Semiconductor Science and Technology

PY  - 2020/06/23

AU  - Walther T

AU  - Nutter J

AU  - Reithmaier JP

AU  - Pavelescu EM

ED  - 

DO  - DOI: 10.1088/1361-6641/ab8c52

PB  - IOP Publishing

VL  - 35

IS  - 8

Y2  - 2025/12/01

ER  -