@article{article, title  = {{How to best measure atomic sergregation to grain boundaries by analytical transmission electron microscopy}},

 publisher = {{Springer-Verlag}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/86358 https://doi.org/10.%E2%80%8B1007/%E2%80%8Bs10853-013-7932-2 }},

 year = {{2014}},

 month = {{6}},

 author = {{Walther T and Hopkinson M and Daneu N and Recnik A and Ohno Y and Inoue K and Yonenaga I}},

 doi = {{10.​1007/​s10853-013-7932-2}},

 volume = {{49}},

 journal = {{Journal of Materials Science}},

 issue = {{11}},

 pages = {{3898-3908}},

 note = {{Accessed on 2025/11/28}}}