TY  - JOUR

T1  - How to best measure atomic sergregation to grain boundaries by analytical transmission electron microscopy

JO  - Journal of Materials Science

UR  - https://eprints.whiterose.ac.uk/id/eprint/86358

UR  - https://doi.org/10.%E2%80%8B1007/%E2%80%8Bs10853-013-7932-2

PY  - 2014/06/01

AU  - Walther T

AU  - Hopkinson M

AU  - Daneu N

AU  - Recnik A

AU  - Ohno Y

AU  - Inoue K

AU  - Yonenaga I

ED  - Kehagias T

DO  - DOI: 10.​1007/​s10853-013-7932-2

PB  - Springer-Verlag

VL  - 49

IS  - 11

SP  - 3898

EP  - 3908

Y2  - 2025/11/01

ER  -