@article{article, title  = {{Secondary ion mass spectrometry, SIMS VIII. A. Benninghoven, K. T. F. Janssen, J. Tumpner and H. W. Werner (Eds.). No of pages: 944. ISBN 0471 930644. Price: £115.00. Wiley, Chichester (1992)}},

 publisher = {{Wiley}},

 url = {{https://doi.org/10.1002/sia.740200411 }},

 year = {{2004}},

 month = {{9}},

 author = {{Short RD}},

 doi = {{10.1002/sia.740200411}},

 volume = {{20}},

 journal = {{Surface and Interface Analysis}},

 issue = {{4}},

 pages = {{326-327}},

 note = {{Accessed on 2026/10/24}}}