TY  - CONF

T1  - Electron energy loss spectroscopic profiling of semiconductor hetero- and nano-structures: theory, implementation, applications

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

PY  - 2018/01/01

AU  - Walther T

ED  - Cullis AG

ED  - Midgley PA

IS  - 180

SP  - 27

EP  - 32

Y2  - 2025/12/01

ER  -