@inproceedings{inproceedings, title  = {{Prediction of the impact of thermal cycling on machine lifetime based on accelerated life testing and finite element analysis}},

 publisher = {{IEEE}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/201860 }},

 year = {{2021}},

 month = {{11}},

 author = {{Hewitt D and Wang J}},

 doi = {{10.1109/iecon48115.2021.9589387}},

 isbn = {{9781665435543}},

 volume = {{2021}},

 journal = {{IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society}},

 pages = {{1-6}},

 note = {{Accessed on 2025/12/06}}}