TY  - CONF

T1  - Prediction of the impact of thermal cycling on machine lifetime based on accelerated life testing and finite element analysis

JO  - IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society

UR  - https://eprints.whiterose.ac.uk/id/eprint/201860

PY  - 2021/11/10

AU  - Hewitt D

AU  - Wang J

ED  - 

DO  - DOI: 10.1109/iecon48115.2021.9589387

PB  - IEEE

SN  - 9781665435543

VL  - 2021

SP  - 1

EP  - 6

Y2  - 2025/11/14

ER  -