TY  - JOUR

T1  - Characterization of plasma‐deposited styrene films by XPS and static SIMS

JO  - Surface and Interface Analysis

UR  - https://doi.org/10.1002/sia.740230104

PY  - 2004/09/15

AU  - Leggett GJ

AU  - Ratner BD

AU  - Vickerman JC

ED  - 

DO  - DOI: 10.1002/sia.740230104

PB  - Wiley

VL  - 23

IS  - 1

SP  - 22

EP  - 28

Y2  - 2025/11/28

ER  -