TY  - JOUR

T1  - Preface of 19th Microscopy of Semiconducting Materials conference

JO  - Journal of Microscopy

PY  - 2016/04/14

AU  - Walther T

AU  - Beanland R

ED  - 

DO  - DOI: 10.1111/jmi.12391

VL  - 262

IS  - 2

SP  - 131

EP  - 133

Y2  - 2025/12/01

ER  -