TY  - CONF

T1  - Microstructural characterisation of ferroelectric thin films in transverse section

JO  - MICROELECTRONIC ENGINEERING

PY  - 1995/01/01

AU  - Reaney IM

ED  - 

VL  - 29

IS  - 1-4

SP  - 277

EP  - 284

Y2  - 2025/11/29

ER  -