TY  - JOUR

T1  - Comment: New technique for determination of static emitter and collector series resistances of bipolar transistors

JO  - Electronics Letters

UR  - https://doi.org/10.1049/el:19810516

PY  - 1981/10/01

AU  - Hawkins RJ

ED  - 

DO  - DOI: 10.1049/el:19810516

PB  - Institution of Engineering and Technology (IET)

VL  - 17

IS  - 20

SP  - 735

EP  - 735

Y2  - 2026/02/04

ER  -