TY  - JOUR

T1  - Throughput-Delay-Reliability Analysis of a Novel URLLC Uplink Multiple Access Scheme

JO  - IEEE Wireless Communications Letters

UR  - https://doi.org/10.1109/lwc.2025.3613394

PY  - 2025/09/25

AU  - Zhang Y

AU  - Chen K-C

AU  - Zheng G

AU  - Chu X

AU  - Xu J

AU  - Liu X

ED  - 

DO  - DOI: 10.1109/lwc.2025.3613394

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SP  - 1

EP  - 1

Y2  - 2025/12/11

ER  -