TY  - CONF

T1  - Optimising the defect filter layer design for III/V QDs on Si for integrated laser applications

JO  - SPIE Proceedings

UR  - https://doi.org/10.1117/12.2076601

PY  - 2015/02/27

AU  - Orchard JR

AU  - Wu J

AU  - Chen S

AU  - Jiang Q

AU  - Ward T

AU  - Beanland R

AU  - Lui H

AU  - Mowbray D

ED  - Huffaker DL

ED  - Eisele H

DO  - DOI: 10.1117/12.2076601

PB  - SPIE

VL  - 9373

SP  - 93730G

EP  - 93730G

Y2  - 2025/11/24

ER  -