TY  - JOUR

T1  - Comparison of different X‐ray‐based scanning electron microscopy methods to detect sub‐nanometre ultra‐thin InAs layers deposited on top of GaAs

JO  - Journal of Microscopy

UR  - https://doi.org/10.1111/jmi.70049

PY  - 2025/11/24

AU  - Walther T

AU  - Creasey‐Gray S

AU  - Boehm S

AU  - Young H

AU  - Yang Y

ED  - 

DO  - DOI: 10.1111/jmi.70049

PB  - Wiley

Y2  - 2025/11/29

ER  -