@article{article, title  = {{Knowledge-enhanced spatiotemporal analysis for anomaly detection in process manufacturing}},

 publisher = {{Elsevier BV}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/233420 }},

 year = {{2024}},

 month = {{5}},

 author = {{Allen L and Lu H and Cordiner J}},

 doi = {{10.1016/j.compind.2024.104111}},

 volume = {{161}},

 journal = {{Computers in Industry}},

 note = {{Accessed on 2025/11/29}}}