TY  - JOUR

T1  - Knowledge-enhanced spatiotemporal analysis for anomaly detection in process manufacturing

JO  - Computers in Industry

UR  - https://eprints.whiterose.ac.uk/id/eprint/233420

PY  - 2024/05/31

AU  - Allen L

AU  - Lu H

AU  - Cordiner J

ED  - 

DO  - DOI: 10.1016/j.compind.2024.104111

PB  - Elsevier BV

VL  - 161

Y2  - 2025/11/29

ER  -