TY  - JOUR

T1  - Deep Probabilistic Principal Component Analysis for Process Monitoring

JO  - IEEE Transactions on Neural Networks and Learning Systems

UR  - https://doi.org/10.1109/tnnls.2024.3386890

PY  - 2025/04/04

AU  - Kong X

AU  - He Y

AU  - Song Z

AU  - Liu T

AU  - Ge Z

ED  - 

DO  - DOI: 10.1109/tnnls.2024.3386890

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 36

IS  - 4

SP  - 7422

EP  - 7436

Y2  - 2025/11/23

ER  -