TY  - JOUR

T1  - Testing from a nondeterministic finite state machine using adaptive state counting

JO  - IEEE Transactions on Computers

UR  - https://doi.org/10.1109/tc.2004.85

PY  - 2004/10/01

AU  - Hierons RM

ED  - 

DO  - DOI: 10.1109/tc.2004.85

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 53

IS  - 10

SP  - 1330

EP  - 1342

Y2  - 2025/11/05

ER  -