@article{article, title  = {{Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope}},

 publisher = {{Wiley}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/91475 https://dx.doi.org/10.1111/jmi.12291 }},

 year = {{2016}},

 month = {{5}},

 author = {{Walther T and Wang X}},

 doi = {{10.1111/jmi.12291}},

 journal = {{Journal of Microscopy}},

 note = {{Accessed on 2025/12/01}}}