TY  - JOUR

T1  - Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope

JO  - Journal of Microscopy

UR  - https://eprints.whiterose.ac.uk/id/eprint/91475

UR  - https://dx.doi.org/10.1111/jmi.12291

PY  - 2016/05/01

AU  - Walther T

AU  - Wang X

ED  - 

DO  - DOI: 10.1111/jmi.12291

PB  - Wiley

Y2  - 2025/12/01

ER  -