TY  - JOUR

T1  - Impact Ionization Coefficients of Digital Alloy and Random Alloy Al<sub>0.85</sub>Ga<sub>0.15</sub>As<sub>0.56</sub>Sb<sub>0.44</sub> in a Wide Electric Field Range

JO  - Journal of Lightwave Technology

UR  - https://doi.org/10.1109/jlt.2022.3169008

PY  - 2022/04/22

AU  - Guo B

AU  - Jin X

AU  - Lee S

AU  - Ahmed SZ

AU  - Jones AH

AU  - Xue X

AU  - Liang B

AU  - Lewis HIJ

AU  - Kodati SH

AU  - Chen D

AU  - Ronningen TJ et al

ED  - 

DO  - DOI: 10.1109/jlt.2022.3169008

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 40

IS  - 14

SP  - 4758

EP  - 4764

Y2  - 2025/11/19

ER  -