@inproceedings{inproceedings, title  = {{Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/215350 }},

 year = {{2023}},

 month = {{5}},

 author = {{Lévai Z and McMinn P}},

 doi = {{10.1109/icst57152.2023.00014}},

 isbn = {{978-1-6654-5667-8}},

 journal = {{2023 IEEE Conference on Software Testing, Verification and Validation (ICST)}},

 pages = {{49-59}},

 note = {{Accessed on 2025/11/29}}}