TY  - CONF

T1  - Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust

JO  - 2023 IEEE Conference on Software Testing, Verification and Validation (ICST)

UR  - https://eprints.whiterose.ac.uk/id/eprint/215350

PY  - 2023/05/26

AU  - Lévai Z

AU  - McMinn P

ED  - 

DO  - DOI: 10.1109/icst57152.2023.00014

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 978-1-6654-5667-8

SP  - 49

EP  - 59

Y2  - 2025/11/29

ER  -