@inproceedings{inproceedings, title  = {{Gate Current Based Health Monitoring Method for Gate Oxide Degradation in SiC MOSFETs}},

 publisher = {{IEEE}},

 url = {{https://doi.org/10.1109/ecce-europe62795.2025.11238483 }},

 year = {{2025}},

 month = {{9}},

 author = {{Jazayeri M and Mohsenzade S and Naghibi J and Mehran K and Davidson J}},

 doi = {{10.1109/ecce-europe62795.2025.11238483}},

 journal = {{2025 Energy Conversion Congress & Expo Europe (ECCE Europe)}},

 pages = {{1-5}},

 note = {{Accessed on 2025/12/17}}}