TY  - JOUR

T1  - High risk regional load attacks in smart grids

JO  - IEEE Internet of Things Journal

UR  - https://eprints.whiterose.ac.uk/id/eprint/226634

PY  - 2025/04/25

AU  - Du M

AU  - Zhang X

AU  - Zhao J

ED  - 

DO  - DOI: 10.1109/jiot.2025.3564490

PB  - Institute of Electrical and Electronics Engineers (IEEE)

Y2  - 2025/11/24

ER  -