TY  - JOUR

T1  - Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers

JO  - Journal of Microscopy

PY  - 2017/11/20

AU  - NORRIS DJ

AU  - MYRONOV M

AU  - LEADLEY DR

AU  - WALTHER T

ED  - 

DO  - DOI: 10.1111/jmi.12654

VL  - 268

IS  - 3

SP  - 288

EP  - 297

Y2  - 2025/12/01

ER  -