@inproceedings{inproceedings, title  = {{Evaluating features for machine learning detection of order- and non-order-dependent flaky tests}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/230092 }},

 year = {{2022}},

 month = {{6}},

 author = {{Parry O and Kapfhammer GM and Hilton M and McMinn P}},

 doi = {{10.1109/icst53961.2022.00021}},

 isbn = {{9781665466806}},

 journal = {{Proceedings of 2022 IEEE Conference on Software Testing, Verification and Validation (ICST)}},

 pages = {{93-104}},

 note = {{Accessed on 2025/11/29}}}