TY  - CONF

T1  - Evaluating features for machine learning detection of order- and non-order-dependent flaky tests

JO  - Proceedings of 2022 IEEE Conference on Software Testing, Verification and Validation (ICST)

UR  - https://eprints.whiterose.ac.uk/id/eprint/230092

PY  - 2022/06/08

AU  - Parry O

AU  - Kapfhammer GM

AU  - Hilton M

AU  - McMinn P

ED  - 

DO  - DOI: 10.1109/icst53961.2022.00021

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 9781665466806

SP  - 93

EP  - 104

Y2  - 2025/11/29

ER  -