TY  - JOUR

T1  - Data-Driven Open-Circuit Fault Diagnosis for PMSM Drives: Feature Extraction via Normalized Current Space Vector Sorting

JO  - IEEE Transactions on Industry Applications

PY  - 2025/12/17

AU  - Li W

AU  - Li H

AU  - Chen X

AU  - Griffo A

AU  - Sun X

ED  - 

DO  - DOI: 10.1109/TIA.2025.3644988

Y2  - 2026/01/18

ER  -