TY  - CONF

T1  - A methodology to characterise the virtual gate effect in a power amplifier

JO  - 2024 IEEE Microwaves, Antennas, and Propagation Conference (MAPCON) Proceedings

UR  - https://eprints.whiterose.ac.uk/id/eprint/221354

PY  - 2024/12/15

AU  - Poluri N

AU  - De Souza MM

ED  - 

PB  - Institute of Electrical and Electronics Engineers (IEEE)

Y2  - 2025/12/07

ER  -