@inproceedings{inproceedings, title  = {{A new back-to-back graded AlGaN barrier for complementary integration technique based on GaN/AlGaN/GaN platform}},

 publisher = {{Institute of Electrical and Electronics Engineers}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/209587 }},

 year = {{2023}},

 month = {{4}},

 author = {{Zhou J and Do H-B and De Souza MM}},

 doi = {{10.1109/edtm55494.2023.10103055}},

 isbn = {{9798350332520}},

 journal = {{2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)}},

 pages = {{1-3}},

 note = {{Accessed on 2025/12/07}}}