TY  - CONF

T1  - Sigma 3 twin growth in Al thin films on Al2O3 observed by FIB microscopy

JO  - ELECTRON MICROSCOPY AND ANALYSIS 1999

PY  - 1999/01/01

AU  - Inkson BJ

AU  - Spolenak R

AU  - Wagner T

ED  - Kiely CJ

IS  - 161

SP  - 335

EP  - 338

Y2  - 2026/07/21

ER  -