TY  - CONF

T1  - Are mutation scores correlated with real fault detection?

JO  - Proceedings of the 40th International Conference on Software Engineering

UR  - https://doi.org/10.1145/3180155.3180183

PY  - 2018/05/27

AU  - Papadakis M

AU  - Shin D

AU  - Yoo S

AU  - Bae D-H

ED  - 

DO  - DOI: 10.1145/3180155.3180183

PB  - ACM

SP  - 537

EP  - 548

Y2  - 2025/11/28

ER  -