@inproceedings{inproceedings, title  = {{A theoretical framework for understanding mutation-based testing methods}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/203530 }},

 year = {{2016}},

 month = {{7}},

 author = {{Shin D and Bae D-H}},

 doi = {{10.1109/icst.2016.22}},

 isbn = {{9781509018260}},

 journal = {{2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)}},

 pages = {{299-308}},

 note = {{Accessed on 2025/11/28}}}