TY  - CONF

T1  - A theoretical framework for understanding mutation-based testing methods

JO  - 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)

UR  - https://eprints.whiterose.ac.uk/id/eprint/203530

PY  - 2016/07/21

AU  - Shin D

AU  - Bae D-H

ED  - 

DO  - DOI: 10.1109/icst.2016.22

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 9781509018260

SP  - 299

EP  - 308

Y2  - 2025/11/28

ER  -