TY  - CONF

T1  - SARE: Structure-aware reliability evaluation and processing for event-based neural systems

JO  - 2026 International Joint Conference on Neural Networks (IJCNN)

UR  - https://eprints.whiterose.ac.uk/id/eprint/247034

PY  - 2026/10/19

AU  - Li H

AU  - Abhayaratne C

ED  - 

DO  - DOI: 10.1109/ijcnn69854.2026.11728562

PB  - Institute of Electrical and Electronics Engineers

SN  - 9798319531360

SP  - 1

EP  - 8

Y2  - 2026/10/25

ER  -