TY  - JOUR

T1  - Optical pattern recognition: architectures and techniques

JO  - Proceedings of the IEEE

UR  - https://doi.org/10.1109/5.488743

PY  - 1996/05/01

AU  - Yu FTS

AU  - Gregory DA

ED  - 

DO  - DOI: 10.1109/5.488743

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 84

IS  - 5

SP  - 733

EP  - 752

Y2  - 2026/02/04

ER  -