TY  - JOUR

T1  - The Kirk effect in the DELDI technology

JO  - Microelectronics Journal

UR  - https://doi.org/10.1016/s0026-2692(99)00119-6

PY  - 2000/01/01

AU  - Qin Z

AU  - Sankara Narayanan EM

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1016/s0026-2692(99)00119-6

PB  - Elsevier BV

VL  - 31

IS  - 3

SP  - 175

EP  - 185

Y2  - 2025/11/24

ER  -