TY  - JOUR

T1  - Efficient state identification for finite state machine-based testing

JO  - IEEE Transactions on Software Engineering

UR  - https://eprints.whiterose.ac.uk/id/eprint/230260

PY  - 2025/09/05

AU  - Turker U

AU  - Hierons R

AU  - Mousavi MR

AU  - El-Fakih K

ED  - 

DO  - DOI: 10.1109/TSE.2025.3604472

PB  - Institute of Electrical and Electronics Engineers

Y2  - 2025/11/18

ER  -