TY  - JOUR

T1  - Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

JO  - Semiconductor Science and Technology

UR  - https://eprints.whiterose.ac.uk/id/eprint/91480

UR  - http://dx.doi.org/10.1088/0268-1242/30/11/114011

PY  - 2015/10/15

AU  - Wang X

AU  - Chauvat MP

AU  - Ruterana P

AU  - Walther T

ED  - 

DO  - DOI: 10.1088/0268-1242/30/11/114011

PB  - IOP Publishing

VL  - 30

IS  - 11

Y2  - 2025/12/01

ER  -