TY  - CONF

T1  - Probing dielectric ceramics surface at sub-micrometer scale

JO  - IOP Conference Series: Materials Science and Engineering

UR  - https://doi.org/10.1088/1757-899x/8/1/012038

PY  - 2010/03/08

AU  - Fiorenza P

AU  - Nigro RL

AU  - Raineri V

AU  - Schmidt R

AU  - Sinclair DC

ED  - 

DO  - DOI: 10.1088/1757-899x/8/1/012038

PB  - IOP Publishing

VL  - 8

SP  - 012038

EP  - 012038

Y2  - 2025/11/29

ER  -