TY  - CONF

T1  - Diversity-aware mutation adequacy criterion for improving fault detection capability

JO  - 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

UR  - https://eprints.whiterose.ac.uk/id/eprint/203531

PY  - 2016/08/04

AU  - Shin D

AU  - Yoo S

AU  - Bae D-H

ED  - 

DO  - DOI: 10.1109/icstw.2016.37

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 9781509036752

SP  - 122

EP  - 131

Y2  - 2025/11/28

ER  -