TY  - JOUR

T1  - X-ray reflectometer for single layer and multilayer coating characterization at 8 keV: An interlaboratory study.

JO  - Rev Sci Instrum

PY  - 2016/10/28

AU  - Gurgew DN

AU  - Broadway DM

AU  - Gubarev M

AU  - Ramsey BD

AU  - Gregory DA

ED  - 

DO  - DOI: 10.1063/1.4965978

VL  - 87

IS  - 10

SP  - 104501

Y2  - 2026/02/04

ER  -