TY  - JOUR

T1  - Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging.

JO  - Nat Commun

PY  - 2012/03/06

AU  - Humphry MJ

AU  - Kraus B

AU  - Hurst AC

AU  - Maiden AM

AU  - Rodenburg JM

ED  - 

DO  - DOI: 10.1038/ncomms1733

VL  - 3

SP  - 730

Y2  - 2025/12/01

ER  -